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NOTE: The brief summary and the updated list of main publications can be obtained from here: http://www.bezirganyan.com/hakob/pdf/xromref.pdf


An ultrahigh-density digital data read-out method based on grazing-angle incidence x-ray backscattering diffraction

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INSTITUTE OF PHYSICS PUBLISHING JOURNAL OF OPTICS A: PURE AND APPLIED OPTICS J. Opt. A: Pure Appl. Opt. 7 (2005) 604–612

Hakob (Akop) P Bezirganyan1, Hayk H Bezirganyan Jr2,
Siranush E Bezirganyan3, PetrosHBezirganyan Jr4
and
Youri G Mossikyan5

1 Department of Solid State Physics, Yerevan State University, #1, Alex Manoogian Street,
Yerevan City, AM 375025, Republic of Armenia
2 Department of Informatics and Applied Mathematics, Yerevan State University,
#1, Alex Manoogian Street, Yerevan City, AM 375025, Republic of Armenia
3 Department of Medical and Biological Physics, Yerevan State Medical University after
Mkhitar Heratsi, #2, Koryun Street, Yerevan City, AM 375025, Republic of Armenia
4 Department of Computer Science, State Engineering University of Armenia,
#105, Terian Street, Yerevan City, AM 375009, Republic of Armenia
5 Yerevan Automated Control Systems Computer Scientific-Research Institute,
#3, H Hakobyan Street, Yerevan City, AM 375033, Republic of Armenia
E-mail: pbezi@x-rom.org


Published on 12 September 2005.

Abstract

An ultrahigh-density x-ray optical data storage medium useful for terabyte-scale memory applications and named X-ROM is proposed. The X-ROM is a nanocrystalline semiconductor layer, in which non-diffracting nanosized reflectors of x-radiation are embedded. The procedure of digital data read-out from the X-ROM can be performed e.g. by the application of a grazing-angle incidence x-ray backscattering diffraction technique under conditions of specular vacuum wave suppression. The surface storage digital data density of the proposed device, with 20 nm/bit linear size of the single-bit domain, is higher by two orders of magnitude than the volumetric data density actually achieved for a three-dimensional optical data storage medium.

Keywords: data read-out, zone-plate-array lithography, grazing-angle incidence x-ray, crystalline layer, backscattering diffraction, specular beam suppression, Mathieu functions.

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